Sign In | Join Free | My lightneasy.org
China ZEIT Group logo
ZEIT Group
Pursuing Excellence without Limits!
Active Member

4 Years

Home > Optical Testing Equipment >

Scratches Dusts Semiconductor Surface Detection Equipment Resolution 1.8μM

ZEIT Group
Contact Now

Scratches Dusts Semiconductor Surface Detection Equipment Resolution 1.8μM

Brand Name : ZEIT

Model Number : SDD0.5-0.5

Certification : Case by case

Place of Origin : Chengdu, P.R.CHINA

MOQ : 1set

Price : Case by case

Payment Terms : T/T

Supply Ability : Case by case

Delivery Time : Case by case

Packaging Details : Wooden case

Size : 1210 mm*1000mm* 1445mm, Customizable

Customizable : Available

Guarantee period : 1 year or case by case

Shipping Terms : By Sea / Air / Multimodal Transport, etc

Detectable defect type : Scratches, Dusts

Resolution : 1.8μm

Contact Now

Scratches Dusts Optical Testing Equipment Semiconductor Surface Detector 1.8μM


Applications
For the process control and yield management of blank mask in the fields of semiconductor display and
integrated circuit chip manufacturing, we use high throughput optical testing technologies to make fast and
accurate automatic detection for the surface defects of blank mask. According to professional user needs,
we have developed series of high throughput MASK inspection machines with reliable quality and high cost
performance ratio, to help glass substrate, mask and panel manufacturers to identify and monitor the mask
defects, reduce the risk of yield and improve their independent ability of R&D for core technologies.

Working Principle
With regards to level and type of surface defect, 4x telecentric lens, specific angle ring light and coaxial light
source are selected as the visual approach. When the device is running, the sample moves along the X
direction and the vision module carries out defect detection along the Y direction.

Features

Model SDD0.5-0.5

Performance detection

Detectable defect type Scratches, Dusts
Detectable defect size 1μm

Detection accuracy
(measured)

100% detection of defects / collection of
defects (scratches, dust)

Detection efficiency

≤10 minutes
( Measured value : 350mm x 300mm Mask)

Optical System Performance

Resolution 1.8μm
Magnification 40x
Visual field 0.5mm x 0.5mm
Blue light illumination 460nm,2.5w


Motion Platform Performance


X, Y two-axis motion
Marble countertop flatness: 2.5μm
Y-axis Z-direction runout precision: ≤ 10.5μm
Y-axis Z-direction runout precision: ≤8.5μm

Note: Customized production available.


Detection Images
Scratches Dusts Semiconductor Surface Detection Equipment Resolution 1.8μM

Our Advantages
We are manufacturer.
Mature process.
Reply within 24 working hours.

Our ISO Certification
Scratches Dusts Semiconductor Surface Detection Equipment Resolution 1.8μM

Parts Of Our Patents
Scratches Dusts Semiconductor Surface Detection Equipment Resolution 1.8μMScratches Dusts Semiconductor Surface Detection Equipment Resolution 1.8μM

Parts Of Our Awards and Qualifications of R&D

Scratches Dusts Semiconductor Surface Detection Equipment Resolution 1.8μMScratches Dusts Semiconductor Surface Detection Equipment Resolution 1.8μM

ZEIT Group, founded in 2018, is a company focused on precision optics, semiconductor materials and high-tech intelligence equipments. Based on our advantages in precision machining of core and screen, optical detection and coating, ZEIT Group has been providing our customers with complete packages of customized and standardized product solutions.

Concentrated on technological innovations, ZEIT Group has more than 60 domestic patents by 2022 and established very close enterprise-college-research cooperations with institutes, universities and industrial association worldwide. Through innovations, self-owned intellectual properties and building up the key process experimental teams, ZEIT Group has become a development base for incubating high-tech products and a training base for high-end personnels.










































Product Tags:

Scratches Dusts Semiconductor Surface Detector 1.8μM

      

Scratches Dusts Surface Defect Detection Equipment 1.8μM

      

Surface Defect Detection Equipment 1.8μm Scratches Dusts

      
Buy cheap Scratches Dusts Semiconductor Surface Detection Equipment Resolution 1.8μM product

Scratches Dusts Semiconductor Surface Detection Equipment Resolution 1.8μM Images

Inquiry Cart 0
Send your message to this supplier
 
*From:
*To: ZEIT Group
*Subject:
*Message:
Characters Remaining: (0/3000)